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Solutions To Improve HBM ESD Robustness of GaN RF HEMTs
2023 45th Annual EOS/ESD Symposium (EOS/ESD)
Deep Learning
Neural Networks
Publication Metrics
Category
Published
Type
International
Indexed In
Scopus
ISBN
9781585373475
Indexes
(Indexed In, Metrics)
Scopus
Important Dates
Published Date
02 Oct 2023
Affiliation Details
Dr. Vishwanath Karad MIT World Peace University
Department of Electrical and Electronics Engineering
Authors
Abhinay Sandupatla
External
Shih-Hung Chen
External
Nikhil Mane
External
Bertrand Parvais
External
Hao Yu
External
NILAM PRADHAN
Faculty
Nadine Collaert
External
External URLs
Publication Link
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85178995910&origin=inward
DOI Link
https://doi.org/10.23919/EOS/ESD58195.2023.10287752
Solutions To Improve HBM ESD Robustness of GaN RF HEMTs | Publications | TRACER